SCANNING ELECTRON MICROSCOPE (FE-SEM) 

In Scanning Electron Microscopy, the electrons removed from the electron source are dropped onto the sample by means of collecting lenses in a column under vacuum. .

Secondary electrons scattered from surface atoms provide information about the sample surface, while back scattered electrons are used to detect elementary differences in the sample surface by the contrast difference between regions with different chemical compositions. The back scattered electrons also provide electron back scattering diffraction (EBSD) images, for example, to help determine the crystallographic structure. The x-rays resulting from the interaction of the electron beam with the sample are collected by an EDS detector and are used in Eneji-Distributed X-Ray Spectroscopy.

Hitachi Regulus 8230 brand / model scanning electron microscope, which operates in our center, has a Cold Field Emission Electron Gun and has a resolution of 0.9 nm at 1 kV. The microscope running in the range of 0.5 to 30 kV can be reduced to up to 10 V thanks to the bundle deceleration feature, thus, depending on the sample properties, it provides high resolution at low working voltages.

Through the EDS detector integrated into the device, the abundance of the elements in the sample can be detected and mapped, the crystallographic structure of the sample is determined by the EBSD detector, and it is possible to obtain information about the internal structures of biological samples, thin films or polymeric materials by means of the STEM detector.

In our center, scanning electron microscope with Cold Field Emission Gun, wide operating voltage range, high resolution capability at low voltages, depending on the sample properties, with the ability to climb up to 2000k magnification, high resolution imaging and high sensitivity characterization material sciences It is equipped to meet the demands of the users in many fields such as physics, chemistry biology, medical sciences.

Device: Hitachi Regulus 8230 FE-SEM