X-RAY DIFFRACTOMETER (XRD)

The X-ray diffraction method (XRD) is based on the fact that each crystal phase breaks X-rays in a characteristic order depending on their specific atomic sequences. For each crystal phase, these diffraction profiles define that crystal as a kind of fingerprint. The X-ray diffraction analysis method does not destroy the sample during analysis and allows for the analysis of even small amounts of samples.

In the X-rays section of the ARUM laboratory there is the Panalytical EMPYREAN brand XRD device. Qualitative and quantitative investigations of rocks, crystal materials, thin films and polymers can be made with the X-Ray Diffraction Device in our unit. In our device, it is possible to see the crystal changes in atmosphere, vacuum and inert gas environment up to 1200 oC.

XRD Device: Panalytical Empyrian

Analysis with XRD;

• Phases in the form of powder, solid and thin film,
• Amount of phases,
• Crystal size,
• Latis parameters,
• Changes in structure,
• Crystal Orientation
• Gives information about atomic positions.