X-RAY FLUORESCENCE SPECTROMETER (XRF)

X-ray fluorescence spectrometry is used to quantitatively and qualitatively evaluate the characteristic X-rays and scattering photons resulting from photon-matter interaction.

The X-rays section of the ARUM laboratory includes the Panalytical ZETIUM brand XRF device. XRF system in our unit; Calculate the energy of X-rays obtained from the analyzed sample and determine the amount of elements by counting the incoming rays while determining the elements. It is important in technological and scientific research considering its fast and sensitive, low sample requirements, ease of use and non-destructive properties. This system is used to measure the heavy metal concentrations (in the Na-U element range) in percentages (%) and in millions (ppm) in samples of different forms such as solid (mineral, metal, rock, soil), liquid (water, oil, petroleum products) and pressed powder. It allows semi-quantitative analysis. Full quantitative analysis using appropriate standard materials can be carried out from the ppm to the percentile level.

XRF system contains 21 standard (Al2O3, BaO, CaO, Cr2O3, CuO, Fe2O3, HfO2, K2O, MgO, Mn2O3, Na2O, NiO, P2O5, PbO, SiO2, SO3, SrO, TiO2, V2O5, ZnO, ZrO) special calibration set is used. With this calibration program, real quantitative analysis of oxidized compounds (mineral, cement, glass industry, ceramic raw material, etc.) at ppm level can be made.

The analysis of a wide variety of samples can be carried out with the melting device and press machine used in sample preparation.

XRF Device: Panalytical Zetium

Analysis with XRF;

Qualitative, semi-quantitative and quantitative analysis of solid and liquid samples as elemental or compound.